Polarization analysis of the scattered radiation by silicon nanoparticles in the infrared

Autori

  • B. García-Cámara University of Cantabria
  • R. Gómez-Medina Instituto de Ciencia de los Materiales de Madrid (CSIC)
  • F. González University of Cantabria
  • J. J. Sáenz Universidad Autónoma de Madrid
  • M. Nieto Vesperinas Instituto de Ciencias de los Materiales de Madrid (CSIC)
  • F. Moreno University of Cantabria

DOI:

https://doi.org/10.1478/C1V89S1P037

Parole chiave:

Nanoparticles, polarization, infrared

Abstract

In this work we have studied the spectral dependence of the linear polarization degree at a right-angle scattering configuration (RASC) for silicon nanoparticles (R ~ 200 nm) in the IR (1-2 μm). For isolated and isotropic particles smaller than the incident wavelength, this parameter is complementary to the conventional spectral analysis for showing deviations from the pure electric dipole-like response due to either magnetic dipole-like or higher-order contributions.

Mount Aetna from Taormina by Thomas Cole (1843)

Dowloads

Pubblicato

2011-09-15

Fascicolo

Vol 89, SUPPLEMENT NO 1 (2011): ELS XIII Conference

Sezione

Conference Papers

Licenza

Creative Commons License
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