A novel probe fabrication process for improvement in scanning near-field optical microscopy

Abstract

The full exploitation of the microscope potentialities as surface science tool on nanometer scale strictly depends on the probe features. Recent developments on fiber probes for Scanning Near Field Optical Microscope are reported. In this frame, new models and prototypes of probes with higher performances in terms of optical power efficiency and polarization selectivity are worked out. A new fabrication method of the probes is settled, based on a chemical etching process, which doubles the aspect ratio of the probe sharpness and improves the optical throughput. Moreover, Finite Domain Time Difference simulation allows the designing of a probe able to act as an evanescent field linear polarizer.